Invention Grant
- Patent Title: Analysis method for supporting classification
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Application No.: US14912876Application Date: 2014-08-05
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Publication No.: US10401275B2Publication Date: 2019-09-03
- Inventor: Barbara Kavsek , Peter Lederer , Peter Taal , Jan van den Boogaart
- Applicant: Siemens Healthcare Diagnostics Products GmbH
- Applicant Address: DE Marburg
- Assignee: Siemens Healthcare Diagnostics Products GmbH
- Current Assignee: Siemens Healthcare Diagnostics Products GmbH
- Current Assignee Address: DE Marburg
- Agency: Dugan & Dugan, PC
- Priority: DE102013216362 20130819
- International Application: PCT/EP2014/066786 WO 20140805
- International Announcement: WO2015/024770 WO 20150226
- Main IPC: G01N15/14
- IPC: G01N15/14 ; G01N33/49 ; G01N21/49 ; G01N15/00 ; G01N15/10 ; G01N21/47

Abstract:
The invention relates to an analysis method for supporting classification, a determination method for determining analysis parameters Ys, Ei, Ii, σi for the analysis method, a computer program product, and an optical analysis system for supporting classification, with which system analysis parameters Ys, Ei, Ii, σi can be defined on the basis of first and second calibration data. The parameters provide classification support according to the discriminant analysis and on the basis of measured values Pi of optical characteristics i, in particular of organic dispersions, and the information content thereof for classification, in particular the diagnosis of disease; and permit a classification proposal or a diagnosis proposal in comparison with a threshold Ys.
Public/Granted literature
- US20160202171A1 ANALYSIS METHOD FOR SUPPORTING CLASSIFICATION Public/Granted day:2016-07-14
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