The present invention relates to a system comprising a light source configured to produce an emitted light beam. An etalon is positioned to receive the light beam and is configured to generate a plurality of product light beams. The etalon is mounted to a support structure at one or more pivot points. A detector is positioned to receive and configured to measure intensity values for the product light beams. A computing device is coupled to the detector. The computing device includes a processor and a memory coupled to the processor so that the processor executes programmed instructions stored in the memory to determine, based on the measured intensity values, a change in position of the etalon relative to the one or more pivot points. Also disclosed are methods for measuring the vibration and monitoring the condition of an object utilizing the system.