Invention Grant
- Patent Title: Orthogonal field probes
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Application No.: US15423191Application Date: 2017-02-02
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Publication No.: US10401389B2Publication Date: 2019-09-03
- Inventor: Daniel Warren van der Weide
- Applicant: vdW Design, LLC
- Applicant Address: US WI Madison
- Assignee: vdW Design, LLC
- Current Assignee: vdW Design, LLC
- Current Assignee Address: US WI Madison
- Agency: Casimir Jones SC
- Agent David W. Staple
- Main IPC: G01R1/24
- IPC: G01R1/24 ; G01R1/067 ; H01P3/06 ; H01P1/24
Abstract:
Provided herein are electric and magnetic field probes for measuring and mapping distributions of such fields on, for example, circuits, antennas and materials.
Public/Granted literature
- US20170219630A1 ORTHOGONAL FIELD PROBES Public/Granted day:2017-08-03
Information query
