Invention Grant
- Patent Title: Line fault signature analysis
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Application No.: US15844235Application Date: 2017-12-15
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Publication No.: US10401412B2Publication Date: 2019-09-03
- Inventor: Prasanna U Rajagopal , Kallikuppa M Sreenivasa , Amit G Kumbasi
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Brian D. Graham; Charles A. Brill; Frank D. Cimino
- Main IPC: G01R19/25
- IPC: G01R19/25 ; G01R31/02 ; G01R31/26

Abstract:
In described examples, a time-domain analyzer is arranged to generate an indication of a number of high-frequency events of an electrical monitor signal that includes a fundamental periodic frequency. The high-frequency events include frequencies higher than the fundamental periodic frequency. A frequency-domain analyzer is arranged to generate frequency band information in response to frequencies of the electrical monitor signal that are higher than the fundamental periodic frequency. A fault detector is arranged to monitor the indication of the number of high-frequency events and the generated frequency band information, and to generate a fault flag in response to the monitored indication of the number of high-frequency events and the generated frequency band information.
Public/Granted literature
- US20180172750A1 LINE FAULT SIGNATURE ANALYSIS Public/Granted day:2018-06-21
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