- Patent Title: Learning method and learning device for convolutional neural network using 1×H convolution for image recognition to be used for hardware optimization, and testing method and testing device using the same
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Application No.: US16255044Application Date: 2019-01-23
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Publication No.: US10402695B1Publication Date: 2019-09-03
- Inventor: Kye-Hyeon Kim , Yongjoong Kim , Insu Kim , Hak-Kyoung Kim , Woonhyun Nam , SukHoon Boo , Myungchul Sung , Donghun Yeo , Wooju Ryu , Taewoong Jang , Kyungjoong Jeong , Hongmo Je , Hojin Cho
- Applicant: Stradvision, Inc.
- Applicant Address: KR Gyeongbuk
- Assignee: StradVision, Inc.
- Current Assignee: StradVision, Inc.
- Current Assignee Address: KR Gyeongbuk
- Agency: Husch Blackwell LLP
- Main IPC: G06K9/62
- IPC: G06K9/62 ; G06N3/08 ; G06K9/42 ; G06T7/11

Abstract:
A method for learning parameters of a CNN for image recognition is provided to be used for hardware optimization which satisfies KPI. The method includes steps of: a learning device (a) instructing a first transposing layer or a pooling layer to generate an integrated feature map by concatenating pixels, per each ROI, on pooled ROI feature maps; (b) instructing a 1×H1 convolutional layer to generate a first adjusted feature map using a first reshaped feature map, generated by concatenating features in H1 channels of the integrated feature map, and instructing a 1×H2 convolutional layer to generate a second adjusted feature map using a second reshaped feature map, generated by concatenating features in H2 channels of the first adjusted feature map; and (c) instructing a second transposing layer or a classifying layer to divide the second adjusted feature map by each pixel, to thereby generate pixel-wise feature maps.
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