Disclosed is a logic circuit using three-dimensionally stacked dual-gate thin-film transistors, including a substrate, a first dual-gate thin-film transistor on the substrate, a second dual-gate thin-film transistor on the first dual-gate thin-film transistor, and a third dual-gate thin-film transistor on the second dual-gate thin-film transistor, wherein the first dual-gate thin-film transistor, the second dual-gate thin-film transistor and the third dual-gate thin-film transistor are electrically connected to each other. The logic circuit of the invention is configured such that dual-gate thin-film transistors are three-dimensionally stacked, whereby the advantages of the dual-gate structure and of thin-film transistors can be exhibited together and the degree of integration can be drastically increased, and a logic gate is made in the area of a single transistor, thereby remarkably simplifying wire and circuit designs.