Invention Grant
- Patent Title: Measuring assembly
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Application No.: US15486038Application Date: 2017-04-12
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Publication No.: US10408597B2Publication Date: 2019-09-10
- Inventor: Raimund Volk
- Applicant: JENOPTIK Industrial Metrology Germany GmbH
- Applicant Address: DE Villingen-Schwenningen
- Assignee: JENOPTIK Industrial Metrology Germany GmbH
- Current Assignee: JENOPTIK Industrial Metrology Germany GmbH
- Current Assignee Address: DE Villingen-Schwenningen
- Agency: Shlesinger, Arkwright & Garvey LLP
- Priority: DE102016107135 20160418
- Main IPC: G01B5/20
- IPC: G01B5/20 ; G01B21/20 ; G01B5/00 ; G01B5/004 ; G01B5/28

Abstract:
A measuring assembly for measuring the contour of a workpiece has a measuring probe that is pivotably supported and deflectable about a first axis (measuring axis) in order to contact a surface of the workpiece, and has a second axis that is associated with the workpiece. The first axis and the second axis are parallel or approximately parallel to one another for radially contacting a surface of the workpiece. A device for rotating the measuring probe and the workpiece relative to one another is provided, such that the measuring probe contacts the surface of the workpiece during the rotation, and a device for plotting the angular deflection of the measuring probe as a function of the particular rotational position of the workpiece relative to the measuring probe is provided.
Public/Granted literature
- US20170336189A1 MEASURING ASSEMBLY Public/Granted day:2017-11-23
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