Invention Grant
- Patent Title: Density measurement system and method
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Application No.: US15510363Application Date: 2015-09-11
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Publication No.: US10408777B2Publication Date: 2019-09-10
- Inventor: Changhua Qiu , Kenneth Primrose
- Applicant: Industrial Tomography Systems PLC
- Applicant Address: GB Manchester
- Assignee: Industrial Tomography Systems PLC
- Current Assignee: Industrial Tomography Systems PLC
- Current Assignee Address: GB Manchester
- Agency: Michael Best & Friedrich LLP
- Priority: GB1416182.2 20140912
- International Application: PCT/GB2015/052643 WO 20150911
- International Announcement: WO2016/038391 WO 20160317
- Main IPC: G01N9/00
- IPC: G01N9/00 ; G01N27/04 ; G01N27/02 ; G01N33/28 ; G05D7/06 ; G01N11/00 ; E02F5/00

Abstract:
A density measurement system for measuring the density of a material within a region, the density measurement system comprises: a plurality of electrodes arranged around the region; an energization source arranged to apply an electrical signal to at least one of said electrodes; a monitor arranged to monitor an electrical parameter at at least one of said electrodes, the monitored electrical parameter being caused to change in response to flow of electrical current within the region; and a processor arranged to: generate data indicative of the complex impedance of the material within the region based upon the monitored electrical parameter; and generate data indicative of the density of the material based upon the data indicative of the complex impedance of the material.
Public/Granted literature
- US20170241929A1 DENSITY MEASUREMENT SYSTEM AND METHOD Public/Granted day:2017-08-24
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