Invention Grant
- Patent Title: Apparatus and method to determine plural locations in communication circuits at which failures have occurred
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Application No.: US15792868Application Date: 2017-10-25
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Publication No.: US10409686B2Publication Date: 2019-09-10
- Inventor: Masazumi Maeda , Koji Migita
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: JP2016-222987 20161116
- Main IPC: G06F11/14
- IPC: G06F11/14 ; G06F11/22 ; H04L12/939 ; H04L12/933

Abstract:
An apparatus includes first and second circuits that transmit and receive information to and from each other through first paths, where each of the first and second circuits includes second paths respectively coupled to the first paths, and matrix switches that are provided across the second paths and switch a transmission path of information transmitted to any one of the second paths. Upon detecting an error in the second paths, the apparatus conducts a loop-back test in which each matrix switch is switched to a loop-back state in which information to be transmitted to the second path in which the error has been detected, is looped back. Upon detecting an error in the loop-back test, the apparatus switches the matrix switches to a bypass state in which the second path in which the error is detected is bypassed to another one of the second paths to continue the loop-back test.
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