Invention Grant
- Patent Title: Intelligent CAA failure pre-diagnosis method and system for design layout
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Application No.: US15684929Application Date: 2017-08-23
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Publication No.: US10409924B2Publication Date: 2019-09-10
- Inventor: Iyun Leu
- Applicant: ELITE SEMICONDUCTOR, INC.
- Applicant Address: TW Hsinchu County
- Assignee: ELITE SEMICONDUCTOR, INC.
- Current Assignee: ELITE SEMICONDUCTOR, INC.
- Current Assignee Address: TW Hsinchu County
- Agency: Li & Cai Intellectual Property (USA) Office
- Priority: TW106111402A 20170405
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
The instant disclosure provides an intelligent CAA (Critical Area Analysis) failure pre-diagnosis system and method for a design layout. The intelligent CAA failure pre-diagnosis method includes the steps of obtaining a design layout of an object and defining at least one layout region having a layout pattern thereon, obtaining a plurality of defects, comparing the defects one-by-one to a predetermined portion of the layout pattern in the order of their sizes, and calculating a CAA failure risk level of the layout region according to the comparison result.
Public/Granted literature
- US20180293334A1 INTELLIGENT CAA FAILURE PRE-DIAGNOSIS METHOD AND SYSTEM FOR DESIGN LAYOUT Public/Granted day:2018-10-11
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