Invention Grant
- Patent Title: Inspection device, storage medium, and program
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Application No.: US15472705Application Date: 2017-03-29
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Publication No.: US10410336B2Publication Date: 2019-09-10
- Inventor: Munehiro Takayama , Akira Kozakai , Masataka Toda , Yukio Ichikawa
- Applicant: AISIN SEIKI KABUSHIKI KAISHA
- Applicant Address: JP Kariya-shi
- Assignee: AISIN SEIKI KABUSHIKI KAISHA
- Current Assignee: AISIN SEIKI KABUSHIKI KAISHA
- Current Assignee Address: JP Kariya-shi
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2016-085357 20160421
- Main IPC: G06T7/00
- IPC: G06T7/00 ; H04N5/225

Abstract:
An inspection device includes: an irradiation unit irradiating an inspection target with light by causing a predetermined position within a display screen to emit light; a captured image acquisition unit acquiring a captured image obtained by imaging the inspection target; a calculation unit calculating coordinates in the display screen corresponding to coordinates in the captured image on the basis of light emission position coordinate information and light reception position coordinate information indicating coordinates of a light emission position and a light reception position; and an inspection pattern creation unit creating an inspection pattern which is displayed on the display screen so that first patterns and second patterns are alternately arranged in the captured image and which is used to inspect presence a defect on a surface of the inspection target, on the basis of a calculation result of the calculation unit.
Public/Granted literature
- US20170309013A1 INSPECTION DEVICE, STORAGE MEDIUM, AND PROGRAM Public/Granted day:2017-10-26
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