Invention Grant
- Patent Title: Non-volatile memories and data reading methods thereof
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Application No.: US15641781Application Date: 2017-07-05
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Publication No.: US10410727B2Publication Date: 2019-09-10
- Inventor: Yi Jin Kwon , Hao Ni , Jim Chia-Ming Hsu , Xiao Yan Liu
- Applicant: Semiconductor Manufacturing International (Shanghai) Corporation , Semiconductor Manufacturing International (Beijing) Corporation
- Applicant Address: CN Shanghai CN Beijing
- Assignee: Semiconductor Manufacturing International (Shanghai) Corporation,Semiconductor Manufacturing International (Beijing) Corporation
- Current Assignee: Semiconductor Manufacturing International (Shanghai) Corporation,Semiconductor Manufacturing International (Beijing) Corporation
- Current Assignee Address: CN Shanghai CN Beijing
- Agency: Anova Law Group, PLLC
- Priority: CN201610531757 20160707
- Main IPC: G11C16/28
- IPC: G11C16/28 ; G11C16/08 ; G11C16/24 ; G11C16/30 ; G11C7/06 ; G11C16/26

Abstract:
A non-volatile memory (NVM) includes at least one memory unit region, each including a memory array and having first memory cells in the odd columns and second memory cells in the even columns. Corresponding to each memory unit region, the NVM includes a multiplexer including first bit line decoders and second bit line decoders, a comparator circuit including a first input terminal and a second input terminal, and a bias generation circuit generating a bias voltage. When reading a data information from a first memory cell, a first output voltage of the first memory cell is sent to the first input terminal and the bias voltage is sent to the second input terminal. When reading a data information from a second memory cell, a second output voltage of the second memory cell is sent to the second input terminal and the bias voltage is sent to the first input terminal.
Public/Granted literature
- US20180012664A1 NON-VOLATILE MEMORIES AND DATA READING METHODS THEREOF Public/Granted day:2018-01-11
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