Invention Grant
- Patent Title: Electron probe microanalyzer and storage medium
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Application No.: US15991034Application Date: 2018-05-29
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Publication No.: US10410825B2Publication Date: 2019-09-10
- Inventor: Hiroshi Sakamae
- Applicant: Shimadzu Corporation
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: Maier & Maier, PLLC
- Priority: JP2017-128850 20170630
- Main IPC: H01J37/256
- IPC: H01J37/256 ; G01N23/2252

Abstract:
An EDS 5 acquires first spectrum data by detecting an X-ray generated from a sample. A WDS 6 acquires second spectrum data by detecting the X-ray generated from the sample. A phase distribution map generation processing unit 11 generates a phase distribution map of a substance of the sample in a measurement region, on the basis of the first spectrum data acquired with respect to each pixel in the measurement region on a sample surface. A composition information acquisition processing unit 13 acquires element composition information of each phase, on the basis of the second spectrum data acquired with respect to a position on the sample corresponding to a representative pixel in the measurement region corresponding to each of the phases of the phase distribution map.
Public/Granted literature
- US20190006146A1 ELECTRON PROBE MICROANALYZER AND STORAGE MEDIUM Public/Granted day:2019-01-03
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