Invention Grant
- Patent Title: Systems and methods for electrical and magnetic uniformity and skew tuning in plasma processing reactors
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Application No.: US14755646Application Date: 2015-06-30
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Publication No.: US10410889B2Publication Date: 2019-09-10
- Inventor: S. M. Reza Sadjadi , Haitao Wang , Jie Zhou , Tza-Jing Gung , Chunlei Zhang , Fernando M. Silveira
- Applicant: APPLIED MATERIALS, INC.
- Applicant Address: US CA Santa Clara
- Assignee: APPLIED MATERIALS, INC.
- Current Assignee: APPLIED MATERIALS, INC.
- Current Assignee Address: US CA Santa Clara
- Agency: Moser Taboada
- Agent Alan Taboada
- Main IPC: C23C16/00
- IPC: C23C16/00 ; H01L21/67 ; C23C16/44 ; C23C16/455 ; C23C16/458 ; C23C16/505 ; H01J37/32 ; C23C16/52

Abstract:
In some embodiments, a plasma processing apparatus includes a processing chamber to process a substrate; a mounting surface defined within the processing chamber to support a substrate disposed within the processing chamber; a showerhead disposed within the processing chamber and aligned so as to face the mounting surface, the showerhead defining a plurality of orifices to introduce a process gas into the processing chamber toward a substrate disposed within the processing chamber; and one or more magnets supported by the showerhead and arranged so that a radial component of a magnetic field applied by each of the one or more magnets has a higher flux density proximate a first region corresponding to an edge surface region of a substrate when disposed within the processing chamber than at a second region corresponding to an interior surface region of a substrate when disposed within the processing chamber.
Public/Granted literature
- US20160027667A1 SYSTEMS AND METHODS FOR ELECTRICAL AND MAGNETIC UNIFORMITY AND SKEW TUNING IN PLASMA PROCESSING REACTORS Public/Granted day:2016-01-28
Information query
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