Invention Grant
- Patent Title: Micro elements transfer device and method
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Application No.: US15871982Application Date: 2018-01-16
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Publication No.: US10410893B2Publication Date: 2019-09-10
- Inventor: Chen-ke Hsu , Jiali Zhuo , Xiaojuan Shao , Jiansen Zheng
- Applicant: XIAMEN SANAN OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Applicant Address: CN Xiamen
- Assignee: XIAMEN SANAN OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee: XIAMEN SANAN OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Xiamen
- Agency: Syncoda LLC
- Agent Feng Ma
- Priority: CN201610961364 20161104
- Main IPC: G11C5/02
- IPC: G11C5/02 ; H01L21/67 ; H01L21/66 ; H01L23/00 ; G01R31/28 ; H01L21/683

Abstract:
A transfer device for micro element with a test circuit can test the micro element during transfer. The transfer device for micro elements includes: a base substrate, having two surfaces opposite to each other; a pick-up head array, formed over the first surface of the base substrate for picking up or releasing the micro element; a test circuit set inside or/on the surface of the base substrate, which has a series of sub-test circuits, each sub-test circuit at least having two test electrodes for simultaneous test of photoelectric parameters of the micro element when the transfer device transfers the micro element.
Public/Granted literature
- US20180158706A1 Micro Elements Transfer Device and Method Public/Granted day:2018-06-07
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