Invention Grant
- Patent Title: Strain-tolerant die attach with improved thermal conductivity, and method of fabrication
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Application No.: US15659889Application Date: 2017-07-26
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Publication No.: US10410958B2Publication Date: 2019-09-10
- Inventor: Robert F. Karlicek, Jr.
- Applicant: SolidUV, Inc.
- Applicant Address: US NY Clifton Park
- Assignee: SolidUV, Inc.
- Current Assignee: SolidUV, Inc.
- Current Assignee Address: US NY Clifton Park
- Agent Jay R. Yablon
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L21/00 ; H01L23/495 ; H01L23/34 ; H01L23/36 ; H01L23/00 ; H01L23/367 ; H01L23/373 ; H01L23/42 ; H01L23/433

Abstract:
A mechanically-stable and thermally-conductive interface device between a semiconductor die and a package for the die, and related method of fabrication, comprising: a semiconductor die; a package for the die; a surface area-enhancing pattern on the package and/or the die; and die attach materials between the die and the package, the die attach materials attaching the die to the package through an interface provided by the die attach materials; wherein: an effective bonding area between the die attach materials and the package and/or the die is greater with the pattern than without the pattern; and the increase of the effective bonding area simultaneously increases the surface area for thermal transport between the package and/or the die, and the die attach materials; and increases the surface area for stably attaching the at least one of the package and the die to the die attach materials.
Public/Granted literature
- US20170323844A1 Strain-Tolerant Die Attach with Improved Thermal Conductivity, and Method of Fabrication Public/Granted day:2017-11-09
Information query
IPC分类: