Invention Grant
- Patent Title: Measurement probe and measuring device
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Application No.: US15647446Application Date: 2017-07-12
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Publication No.: US10415947B2Publication Date: 2019-09-17
- Inventor: Hideyuki Arai , Kazuya Iwasaki , Minoru Tanaka , Shuichi Kamiyama , Kazuhiko Hidaka
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2016-141320 20160719
- Main IPC: G01B5/016
- IPC: G01B5/016 ; G01B5/00 ; G01B5/02 ; G01B5/12 ; G01B5/14

Abstract:
A probe includes a movable plate to which a stylus capable of contacting a measurable object is mounted, the movable plate displaceable in an X direction; a static plate arranged to overlap with the movable plate; a counter plate facing the movable plate and the static plate; an elastic movable side connection plate, the movable side connection plate connecting the counter plate at at least three places with each of a first end connector positioned toward a first end of the movable plate in the X direction and second end connectors positioned toward a second end in the X direction; and a static side connection plate which connects the static plate and the counter plate. An entire length of the first end connector in a Y direction orthogonal to the X direction is the same size as the entire length of the second end connectors in the Y direction.
Public/Granted literature
- US20180023936A1 MEASUREMENT PROBE AND MEASURING DEVICE Public/Granted day:2018-01-25
Information query