Invention Grant
- Patent Title: Inspection system
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Application No.: US15448487Application Date: 2017-03-02
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Publication No.: US10417754B2Publication Date: 2019-09-17
- Inventor: Yuki Kimura , Akira Matsui , Shingo Inazumi
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Priority: JP2016-130458 20160630
- Main IPC: H04N7/18
- IPC: H04N7/18 ; G06T7/00 ; B25J9/00 ; G01N21/88 ; G01B11/10 ; G01B11/24 ; G01N21/95 ; G01N21/952 ; G01B11/14 ; G01B11/245

Abstract:
An inspection system is provided with an inspection device configured to examine the external features of an object; and a control device for controlling the inspection device; the inspection device including: a substantially column-shaped first barrel that includes a first through hole configured for an object to pass therethrough; and a plurality of imaging units provided on the inner peripheral surface which forms the first through hole in the first barrel; and the control device including: an image processing unit configured to process an image captured and output by each of the imaging units for the purpose of inspection.
Public/Granted literature
- US20180005365A1 INSPECTION SYSTEM Public/Granted day:2018-01-04
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