Invention Grant
- Patent Title: Substrate processing method
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Application No.: US15609128Application Date: 2017-05-31
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Publication No.: US10418589B2Publication Date: 2019-09-17
- Inventor: Il Ho Noh , Seung Duk Bang , Beom Jun Kim , Soo Ho Oh , Sin Pyoung Kim
- Applicant: WONIK IPS Co., Ltd.
- Applicant Address: KR Pyeongtaek-si, Gyeonggi-do
- Assignee: WONIK IPS CO., LTD.
- Current Assignee: WONIK IPS CO., LTD.
- Current Assignee Address: KR Pyeongtaek-si, Gyeonggi-do
- Agency: William Park & Associates Ltd.
- Priority: KR10-2016-0088197 20160712; KR10-2016-0088201 20160712
- Main IPC: H01L51/56
- IPC: H01L51/56 ; H01L51/52 ; H01L51/00

Abstract:
A substrate processing system and substrate processing method. The substrate processing system includes: a chamber; a susceptor disposed inside the chamber and allowing a substrate to be seated thereon; a mask member disposed over the substrate; and a controller for controlling an arrangement height of the mask member with respect to the substrate. Here, an encapsulation layer covering a device formed on the substrate is formed using the mask member adjusted in height by the controller. The substrate processing method includes disposing a substrate inside a chamber; disposing a mask member over the substrate inside the chamber; and forming an encapsulation layer covering a device formed on the substrate by adjusting an arrangement height of the mask member with respect to the substrate.
Public/Granted literature
- US20180019441A1 SUBSTRATE PROCESSING SYSTEM AND SUBSTRATE PROCESSING METHOD Public/Granted day:2018-01-18
Information query
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