• Patent Title: Abnormality detection method for electromagnetic relay, abnormality detection circuit for electromagnetic relay, and abnormality detection system
  • Application No.: US15113366
    Application Date: 2014-08-05
  • Publication No.: US10424449B2
    Publication Date: 2019-09-24
  • Inventor: Norikazu Nishio
  • Applicant: OMRON Corporation
  • Applicant Address: JP Kyoto-shi
  • Assignee: OMRON Corporation
  • Current Assignee: OMRON Corporation
  • Current Assignee Address: JP Kyoto-shi
  • Agency: Metrolex IP Law Group, PLLC
  • Priority: JP2014-037294 20140227
  • International Application: PCT/JP2014/070619 WO 20140805
  • International Announcement: WO2015/129070 WO 20150903
  • Main IPC: H01H47/00
  • IPC: H01H47/00 G01R31/327
Abnormality detection method for electromagnetic relay, abnormality detection circuit for electromagnetic relay, and abnormality detection system
Abstract:
An abnormal operation of a movable contact is correctly detected. The abnormal operation of the movable contact (9) to the fixed contact (10) is detected based on at least one of a separation transient response signal of a coil current passed through the excitation coil (6) during the supply of a separation pulse signal and an attraction transient response signal of the coil current during the supply of an attraction pulse signal.
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