Invention Grant
- Patent Title: Microelectromechanical sensor device with reduced stress-sensitivity and corresponding manufacturing process
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Application No.: US15880332Application Date: 2018-01-25
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Publication No.: US10427933B2Publication Date: 2019-10-01
- Inventor: Enri Duqi , Sebastiano Conti
- Applicant: STMICROELECTRONICS S.R.L.
- Applicant Address: IT Agrate Brianza
- Assignee: STMicroelectronics S.r.l.
- Current Assignee: STMicroelectronics S.r.l.
- Current Assignee Address: IT Agrate Brianza
- Agency: Seed Intellectual Property Law Group LLP
- Priority: ITMI2015A0852 20150911
- Main IPC: B81B7/00
- IPC: B81B7/00 ; B81B3/00 ; B81C1/00

Abstract:
A MEMS device is provided with: a supporting base, having a bottom surface in contact with an external environment; a sensor die, which is of semiconductor material and integrates a micromechanical detection structure; a sensor frame, which is arranged around the sensor die and is mechanically coupled to a top surface of the supporting base; and a cap, which is arranged above the sensor die and is mechanically coupled to a top surface of the sensor frame, a top surface of the cap being in contact with an external environment. The sensor die is mechanically decoupled from the sensor frame.
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