Invention Grant
- Patent Title: Sensor for non-destructive characterization of objects
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Application No.: US15735353Application Date: 2016-06-13
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Publication No.: US10429322B2Publication Date: 2019-10-01
- Inventor: Noël Deferm , Tom Redant , Wim Dehaene , Patrick Reynaert
- Applicant: HAMMER-IMS
- Applicant Address: BE Hasselt
- Assignee: HAMMER-IMS
- Current Assignee: HAMMER-IMS
- Current Assignee Address: BE Hasselt
- Agency: Workman Nydegger
- Priority: GB1510234.6 20150612
- International Application: PCT/EP2016/063484 WO 20160613
- International Announcement: WO2016/198690 WO 20161215
- Main IPC: G01N22/02
- IPC: G01N22/02 ; G01N33/34 ; G01N33/36 ; G01N21/86 ; G01N21/3581 ; G01N21/89 ; G01N21/898 ; G01B7/06 ; G01B11/06
Abstract:
The present invention relates to a millimeter or terahertz wave sensor for providing inline inspection, preferably including but not limited to continuous monitoring of objects, for example thin sheet dielectric material.
Public/Granted literature
- US20180180557A1 SENSOR FOR NON-DESTRUCTIVE CHARACTERIZATION OF OBJECTS Public/Granted day:2018-06-28
Information query
