Invention Grant
- Patent Title: Model creation method and device, and inspection device using the same
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Application No.: US15103929Application Date: 2013-12-16
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Publication No.: US10429357B2Publication Date: 2019-10-01
- Inventor: Hirohisa Mizota , Yoshiaki Nagashima , Kazuyuki Nakahata
- Applicant: HITACHI, LTD.
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- International Application: PCT/JP2013/083545 WO 20131216
- International Announcement: WO2015/092841 WO 20150625
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G01N29/44 ; G01N23/203

Abstract:
There is provided an analysis model creation method which is capable of simply and quickly creating an accurate analysis model with respect to a structure including a crystalline material. In order to solve a problem described above, there is provided a model creation method of an analysis region used in numeral analysis, the method including a step of designating a crystal growth direction if a region is a region including crystallinity including acoustic anisotropy in the analysis region, a step of selecting partial image data to which the crystallinity of the region is reflected, a step of rotating and operating the partial image data along the crystal growth direction, and a step of creating image data which is covered in the region designated using the rotated partial image data.
Public/Granted literature
- US20160320352A1 MODEL CREATION METHOD AND DEVICE, AND INSPECTION DEVICE USING THE SAME Public/Granted day:2016-11-03
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