Invention Grant
- Patent Title: Method and apparatus for determining mistaken approaching or touching event
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Application No.: US14587343Application Date: 2014-12-31
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Publication No.: US10429991B2Publication Date: 2019-10-01
- Inventor: Chin-Fu Chang , Shang-Tai Yeh , Jen-Yi Sun
- Applicant: EGALAX_EMPIA TECHNOLOGY INC.
- Applicant Address: TW Taipei
- Assignee: EGALAX_EMPIA TECHNOLOGY INC.
- Current Assignee: EGALAX_EMPIA TECHNOLOGY INC.
- Current Assignee Address: TW Taipei
- Agency: WPAT, PC
- Priority: TW103117027 20140514
- Main IPC: G06F3/041
- IPC: G06F3/041 ; G06F3/044

Abstract:
The present application provides a method for determining mistaken approaching/touching event, comprising: gathering one or more touch sensitive signal value corresponding to a line piece; calculating a sum of differences of each signal value and a baseline value; and if the sum is less than or equals to zero, determining the line piece is corresponding to a mistaken approaching/touching event.
Public/Granted literature
- US20150331541A1 METHOD AND APPARATUS FOR DETERMINING MISTAKEN APPROACHING OR TOUCHING EVENT Public/Granted day:2015-11-19
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