Systems and methods include receiving an indication of a selection of a first piece of equipment in an industrial monitoring system. The systems and methods also include determining a first feature of interest in a plot corresponding to a first sensor. Additionally, the systems and methods include matching the first feature of interest with corresponding second features of interest in a second plot. Furthermore, the systems and methods include overlaying the first plot with the second plot based at least in part on the first feature of interest and the corresponding second feature of interest.