According to one embodiment, a semiconductor device includes a non-volatile memory, a temperature measurement circuit that measures a temperature of the non-volatile memory, and a controller. The controller also writes information about the temperature which is measured by the temperature measurement circuit in the non-volatile memory together when writing data in the non-volatile memory. Further, the controller performs write-back processing of writing data, which is written at a temperature in a rewriting temperature range, back when the temperature measured by the temperature measurement circuit is not in the rewriting temperature range.