Invention Grant
- Patent Title: Scan circuit unit, driving method thereof, gate drive circuit, and display apparatus
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Application No.: US15811912Application Date: 2017-11-14
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Publication No.: US10431144B2Publication Date: 2019-10-01
- Inventor: Lirong Wang
- Applicant: BOE TECHNOLOGY GROUP CO., LTD.
- Applicant Address: CN Beijing
- Assignee: BOE TECHNOLOGY GROUP CO., LTD.
- Current Assignee: BOE TECHNOLOGY GROUP CO., LTD.
- Current Assignee Address: CN Beijing
- Agency: Calfee, Halter & Griswold LLP
- Priority: CN201710254122 20170418
- Main IPC: G11C19/28
- IPC: G11C19/28 ; G09G3/3266 ; G09G3/20 ; G09G3/36

Abstract:
A scan circuit unit includes a shift register unit; a first set of transistors operable to selectively transfer a first clock signal to a first output terminal in dependence on an output pulse signal of the shift register unit, and to selectively transfer an inactive level voltage to the first output terminal in dependence on a second clock signal; and a second set of transistors operable to selectively transfer the second clock signal to a second output terminal in dependence on the output pulse signal, and to selectively transfer the inactive level voltage to the second output terminal in dependence on the first clock signal.
Public/Granted literature
- US20180301081A1 SCAN CIRCUIT UNIT, DRIVING METHOD THEREOF, GATE DRIVE CIRCUIT, AND DISPLAY APPARATUS Public/Granted day:2018-10-18
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