Invention Grant
- Patent Title: Memory device
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Application No.: US15703340Application Date: 2017-09-13
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Publication No.: US10431277B2Publication Date: 2019-10-01
- Inventor: Kosuke Hatsuda , Yorinobu Fujino
- Applicant: TOSHIBA MEMORY CORPORATION
- Applicant Address: JP Tokyo
- Assignee: TOSHIBA MEMORY CORPORATION
- Current Assignee: TOSHIBA MEMORY CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Holtz, Holtz & Volek PC
- Priority: JP2017-059602 20170324
- Main IPC: G11C11/16
- IPC: G11C11/16 ; G11C13/00

Abstract:
According to one embodiment, a memory device includes a memory cell; and a first circuit configured to perform first read for the memory cell and generate a first voltage, write first data to the memory cell that has undergone the first read, perform second read for the memory cell to which the first data is written and generate a second voltage, and determine data stored in the memory cell at the time of the first read based on the first voltage and the second voltage, wherein when writing the first data, the first circuit electrically sets a generation unit configured to generate the second voltage in a floating state.
Public/Granted literature
- US20180277186A1 MEMORY DEVICE Public/Granted day:2018-09-27
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