Invention Grant
- Patent Title: Surface measurement probe
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Application No.: US15522127Application Date: 2015-11-02
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Publication No.: US10436562B2Publication Date: 2019-10-08
- Inventor: Bertrand Bellaton , Marcello Conte
- Applicant: ANTON PARR TRITEC SA
- Applicant Address: CH Peseux
- Assignee: ANTON PAAR TRITEC SA
- Current Assignee: ANTON PAAR TRITEC SA
- Current Assignee Address: CH Peseux
- Agency: Duane Morris LLP
- Agent Gregory M. Lefkowitz; Jason M. Nolan
- Priority: EP14191442 20141103
- International Application: PCT/EP2015/075491 WO 20151102
- International Announcement: WO2016/071296 WO 20160512
- Main IPC: G01B3/22
- IPC: G01B3/22 ; G01Q30/10 ; G01Q60/36 ; G01N3/42

Abstract:
Surface measurement probe comprising: a hollow probe body extending along a longitudinal axis and comprising a proximal end adapted to be mounted to a test apparatus and a distal end; a retaining arrangement situated inside the probe body and extending along said longitudinal axis, the retaining arrangement being arranged to maintain the surface measurement probe in an assembled state; a probe tip supported at the distal end of the probe body and arranged to contact a sample; a bead situated inside the probe body and interposed between the probe tip and the retaining arrangement, the bead comprising a thermally-insulating material.
Public/Granted literature
- US20170336188A1 SURFACE MEASUREMENT PROBE Public/Granted day:2017-11-23
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