Heating arrangement for a materials testing device, the materials testing device comprising at least one surface measurement probe adapted to be brought into contact with a surface of a sample, the heating arrangement comprising a probe heater comprising: an infrared emitting element adapted to emit infrared radiation; a reflector having a reflective surface arranged to direct said infrared radiation towards a distal end of said surface measurement probe. According to the invention, the reflector comprises a first focal point and a second focal point, the infrared emitting element being situated substantially at said first focal point.