Invention Grant
- Patent Title: Method for quantifying the amount of optically interfering gas impurities
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Application No.: US16076729Application Date: 2017-02-10
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Publication No.: US10436708B2Publication Date: 2019-10-08
- Inventor: Johan Hellgren , Henrik Vennerberg , Fredrik Enquist
- Applicant: INFICON GmbH
- Applicant Address: CH Bad Ragaz
- Assignee: INFICON GmbH
- Current Assignee: INFICON GmbH
- Current Assignee Address: CH Bad Ragaz
- Agency: The Webb Law Firm
- Priority: EP16155276 20160211
- International Application: PCT/EP2017/053012 WO 20170210
- International Announcement: WO2017/137565 WO 20170817
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/27 ; G01N21/3504 ; G01N33/00 ; G01N21/37 ; G01N21/85

Abstract:
Described is a method for quantifying the amount of optically interfering gas impurities in a gas detection system comprising a sample gas inlet, a reference gas inlet, a gas modulation valve, and an infrared absorption gas detector used for analysis of methane or natural gas, wherein the gas modulation valve alternatingly connects the sample gas inlet to the gas detector during a sample gas time period and the reference gas inlet to the gas detector during a reference gas time period. The method includes measuring an infrared absorption for at least two different sample gas concentrations in the gas detector achieved via respective different ratios from the sample gas time period and the reference gas time period, and comparing amplitudes of different measurement signals of the at least two different sample gas concentrations with calibration functions to assess an actual gas impurity concentration in the sampled gas.
Public/Granted literature
- US20190041317A1 Method for Quantifying the Amount of Optically Interfering Gas Impurities Public/Granted day:2019-02-07
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