Invention Grant
- Patent Title: Method of measuring capacitance of row and column electrodes of capacitive imaging device
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Application No.: US15455378Application Date: 2017-03-10
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Publication No.: US10436733B2Publication Date: 2019-10-08
- Inventor: Hans Ulrich Meyer
- Applicant: Advanced Sensor Technology Limited
- Applicant Address: CH Morges
- Assignee: HEMY8 SA
- Current Assignee: HEMY8 SA
- Current Assignee Address: CH Morges
- Agency: Leydig, Voit & Mayer
- Main IPC: G01R27/26
- IPC: G01R27/26 ; G01N27/22 ; G06F3/044 ; G06F3/041 ; G06K9/00 ; G06F3/0354

Abstract:
A capacitive imaging method or device using an array of row electrodes 101 and column electrodes 102 on a substrate 100, wherein cross-capacitance between row and column electrodes is obtained from row electrode 101 self-capacitance measured with the remaining electrodes grounded, column electrode 102 self-capacitance measured with the remaining electrodes grounded, and combined row and column electrode self-capacitance measured with the remaining electrodes grounded. A preferred embodiment is a hand-held wall scanner for detecting hidden features having a two-dimensional display the size of the array and located over it. Hidden features influencing row-to-column cross-capacitances are thus imaged in real size and at their real location.
Public/Granted literature
- US20170261459A1 CAPACITIVE IMAGING DEVICE AND METHOD USING ROW AND COLUMN ELECTRODES Public/Granted day:2017-09-14
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