A measurement device for measuring the impedance of a device under test is described. Said measurement device comprises at least one signal generator for generating a signal with a certain frequency wherein said signal is used for testing said device under test. Said measurement device further has at least one shunt resistor that is used for determining the electric current of said signal. Said device also comprise at least two voltage channels for measuring the voltage across said device under test. Said measurement device is an oscilloscope having at least four voltage inputs and wherein said measurement device is configured to derive the impedance of said device from said electric current and said voltage. Further, a method for measuring the impedance of a device under test is described.