Invention Grant
- Patent Title: Evaluation apparatus and evaluation method
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Application No.: US15676393Application Date: 2017-08-14
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Publication No.: US10436833B2Publication Date: 2019-10-08
- Inventor: Akira Okada , Kinya Yamashita , Masaki Ueno , Takaya Noguchi
- Applicant: Mitsubishi Electric Corporation
- Applicant Address: JP Tokyo
- Assignee: Mitsubishi Electric Corporation
- Current Assignee: Mitsubishi Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Studebaker & Brackett PC
- Priority: JP2016-252440 20161227
- Main IPC: G01R31/26
- IPC: G01R31/26 ; G01R1/073 ; G05B15/02

Abstract:
Provided is a technique capable of preventing occurrence of partial discharge. An evaluation apparatus includes a probe disposed on an undersurface of an upper component; a sidewall part disposed on the undersurface of the upper component and enclosing sides of the probe; and a first gas supplying part. The first gas supplying part is capable of supplying a gas to a to-be-measured object that is placed on a stage when the sidewall part comes in proximity to the stage, and to a space enclosed by the stage, the sidewall part, and the upper component when the sidewall part is in contact with the stage.
Public/Granted literature
- US20180180660A1 EVALUATION APPARATUS AND EVALUATION METHOD Public/Granted day:2018-06-28
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