Invention Grant
- Patent Title: Inspection systems for quarantine and methods thereof
-
Application No.: US15279207Application Date: 2016-09-28
-
Publication No.: US10436932B2Publication Date: 2019-10-08
- Inventor: Qitian Miao , Zhiqiang Chen , Li Zhang , Yunda Sun , Ming Huang , Qingping Huang , Ming Hu , Lei Lei , Jie Xia
- Applicant: NUCTECH COMPANY LIMITED , CINTS CO. LTD.
- Applicant Address: CN Beijing CN Beijing
- Assignee: NUCTECH COMPANY LIMITED,CINTS CO., LTD.
- Current Assignee: NUCTECH COMPANY LIMITED,CINTS CO., LTD.
- Current Assignee Address: CN Beijing CN Beijing
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- Priority: CN201511010081 20151229
- Main IPC: G01N23/046
- IPC: G01N23/046 ; G01V5/00

Abstract:
The present disclosure discloses an inspection system for quarantine and a method thereof. The CT technology is applied to the field of quarantine supervision, overcoming a problem of objects in an image of a single-view or a multi-view X-ray machine being overlapped, as well as a problem of organics including contrabands in a conventional CT image being not highlighted, not elaborated, and having bad contrast. Accuracy and efficiency of inspecting an object by human operator for quarantine inspection can be considerably improved, which is of a high application value.
Public/Granted literature
- US20170184756A1 INSPECTION SYSTEMS FOR QUARANTINE AND METHODS THEREOF Public/Granted day:2017-06-29
Information query