Invention Grant
- Patent Title: Defect reporting in application testing
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Application No.: US15544287Application Date: 2015-01-29
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Publication No.: US10437717B2Publication Date: 2019-10-08
- Inventor: Adi Kidron , Tsila Cochavi , Avigad Mizrahi
- Applicant: ENTIT SOFTWARE LLC
- Applicant Address: US CA Sunnyvale
- Assignee: ENTIT SOFTWARE LLC
- Current Assignee: ENTIT SOFTWARE LLC
- Current Assignee Address: US CA Sunnyvale
- International Application: PCT/US2015/013465 WO 20150129
- International Announcement: WO2016/122517 WO 20160804
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F11/36

Abstract:
The present subject matter relates to defect reporting in application testing. In an implementation, a category of application testing is determined based on a testing instance of an application. The category of application testing is indicative of an aspect of the application, being tested. A list of previously reported defects associated with the determined category of application testing is displayed in a display layer over the testing instance of the application. A first user-input indicative of one of acceptance and rejection of a previously reported defect, from the list, with respect to the testing instance of the application is received. The first user-input is aggregated with previous user-inputs indicative of one of acceptance and rejection of the previously reported defect. It is determined whether the previously reported defect is irrelevant to the testing instance of the application based on the aggregation.
Public/Granted literature
- US20180004648A1 DEFECT REPORTING IN APPLICATION TESTING Public/Granted day:2018-01-04
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