A method and a system for providing a virtual semiconductor product replicating a real semiconductor product are provided. The method for providing the virtual semiconductor product according to an exemplary embodiment of the present disclosure includes: obtaining data which is used for manufacturing a real semiconductor; virtually producing a semiconductor product using the obtained manufacturing data; and providing the virtually produced virtual semiconductor product. Accordingly, the virtual semiconductor product replicating the real semiconductor product is provided in real time with real processing steps, such that time and expense required to measure and examine a semiconductor product can be minimized and a delay in producing semiconductor products is not caused.