- Patent Title: Systems and methods to determine motion parameters using RFID tags
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Application No.: US15295103Application Date: 2016-10-17
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Publication No.: US10438031B2Publication Date: 2019-10-08
- Inventor: John R. Tuttle
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee Address: US ID Boise
- Agency: Greenberg Traurig, LLP
- Main IPC: G06K7/10
- IPC: G06K7/10 ; G01S11/10 ; G01S13/75 ; G06K7/00
Abstract:
Systems and methods to determine motion parameters of physical objects using radio frequency identification (RFID) tags attached to the objects. In one embodiment, a method implemented in a radio frequency identification (RFID) system includes determining a motion parameter of the RFID tag based on detecting a Doppler frequency shift in a radio frequency signal received from the RFID tag.
Public/Granted literature
- US20170032157A1 SYSTEMS AND METHODS TO DETERMINE MOTION PARAMETERS USING RFID TAGS Public/Granted day:2017-02-02
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