A semiconductor device may include a plurality of memory banks and an output buffer that couples to the plurality of memory banks. The output buffer may produce a data voltage signal representative of data to be read from at least one of the plurality of memory banks. The semiconductor device may also include a driver circuit having a pulse generator and a pull-down switch that couples the output buffer to ground, such that the pull-down switch provides the data voltage signal to the output buffer. The semiconductor device may also include a test mode circuit that determines whether the data voltage signal is acceptable and sends an enable signal to the pulse generator in response to the data voltage signal not being acceptable. The enable signal causes the pulse generator to effectively operate with variations in processing, temperature, and voltage properties associated with testing.