Invention Grant
- Patent Title: Zero test time memory using background built-in self-test
-
Application No.: US15478666Application Date: 2017-04-04
-
Publication No.: US10438678B2Publication Date: 2019-10-08
- Inventor: Igor Arsovski , Eric D. Hunt-Schroeder , Michael A. Ziegerhofer
- Applicant: GLOBALFOUNDRIES INC.
- Applicant Address: KY Grand Cayman
- Assignee: GLOBALFOUNDRIES INC.
- Current Assignee: GLOBALFOUNDRIES INC.
- Current Assignee Address: KY Grand Cayman
- Agency: Roberts Mlotkowski Safran Cole & Calderon, P.C.
- Agent Anthony Canale; Andrew M. Calderon
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C29/12 ; G06F12/1027 ; G11C8/16 ; G11C29/04
Abstract:
The present disclosure relates to a structure which includes a memory which is configured to enable zero test time built-in self-test (BIST) at a read/write port while concurrently performing at least one functional read operation at a read port.
Public/Granted literature
- US20180286491A1 ZERO TEST TIME MEMORY USING BACKGROUND BUILT-IN SELF-TEST Public/Granted day:2018-10-04
Information query
