Invention Grant
- Patent Title: Method of quasi atomic layer etching
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Application No.: US15697168Application Date: 2017-09-06
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Publication No.: US10438797B2Publication Date: 2019-10-08
- Inventor: Hongyun Cottle , Andrew W. Metz
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Wood Herron & Evans LLP
- Main IPC: H01L21/33
- IPC: H01L21/33 ; H01L21/033 ; H01L21/02 ; H01L21/311

Abstract:
Techniques herein include an etch process that etches a layer of material incrementally, similar to mono-layer etching of atomic layer etching (ALE), but not necessarily including self-limiting, mono-layer action of ALE. Such techniques can be considered as quasi-atomic layer etching (Q-ALE). Techniques herein are beneficial to precision etching applications such as during soft-mask open. Techniques herein enable precise transfer of a given mask pattern into an underlying layer. By carefully controlling the polymer deposition relative to polymer assisted etching through its temporal cycle, a very thin layer of conformal polymer can be activated and used to precisely etch and transfer the desired patterns.
Public/Granted literature
- US20180068852A1 Method of Quasi Atomic Layer Etching Public/Granted day:2018-03-08
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