Invention Grant
- Patent Title: Low-cost SOI FinFET technology
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Application No.: US15827195Application Date: 2017-11-30
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Publication No.: US10438858B2Publication Date: 2019-10-08
- Inventor: Stephen W. Bedell , Joel P. de Souza , Alexander Reznicek , Devendra K. Sadana , Dominic J. Schepis
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: Internationa Business Machines Corporation
- Current Assignee: Internationa Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Hoffman Warnick LLC
- Agent Steven J. Meyers
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L21/84 ; H01L21/762 ; H01L29/66 ; H01L21/02 ; H01L21/306 ; H01L21/308

Abstract:
A method of forming an SOI fin using a porous semiconductor. The method may include forming a stack of semiconductor layers on a substrate, the stack includes a second semiconductor layer on a first semiconductor layer in a layered region; forming fins in the second semiconductor layer by etching a trench through an exposed portion of the of the second semiconductor layer; converting the first semiconductor layer into a porous semiconductor layer using a porousification process; and converting the porous semiconductor layer into an oxide layer.
Public/Granted literature
- US20180082910A1 LOW-COST SOI FINFET TECHNOLOGY Public/Granted day:2018-03-22
Information query
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