Invention Grant
- Patent Title: Semiconductor device
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Application No.: US15913947Application Date: 2018-03-07
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Publication No.: US10438966B2Publication Date: 2019-10-08
- Inventor: Tomonari Shioda , Junya Fujita , Tatsuro Nishimoto , Yoshiaki Fukuzumi , Atsushi Fukumoto , Hajime Nagano
- Applicant: Toshiba Memory Corporation
- Applicant Address: JP Minato-ku
- Assignee: Toshiba Memory Corporation
- Current Assignee: Toshiba Memory Corporation
- Current Assignee Address: JP Minato-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2017-163616 20170828
- Main IPC: H01L27/11582
- IPC: H01L27/11582 ; H01L27/11556 ; H01L29/78 ; H01L29/10 ; H01L29/36 ; H01L21/28 ; H01L27/11565 ; H01L51/52

Abstract:
According to one embodiment, the silicon layer includes phosphorus. The buried layer is provided on the silicon layer. The stacked body is provided on the buried layer. The stacked body includes a plurality of electrode layers stacked with an insulator interposed. The semiconductor body extends in a stacking direction of the stacked body through the stacked body and through the buried layer, and includes a sidewall portion positioned at a side of the buried layer. The silicon film is provided between the buried layer and the sidewall portion of the semiconductor body. The silicon film includes silicon as a major component and further includes at least one of germanium or carbon.
Public/Granted literature
- US20190067317A1 SEMICONDUCTOR DEVICE Public/Granted day:2019-02-28
Information query
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