- Patent Title: MEMS-based wafer level packaging for thermo-electric IR detectors
-
Application No.: US14958552Application Date: 2015-12-03
-
Publication No.: US10439118B2Publication Date: 2019-10-08
- Inventor: Arvin Emadi , Nicole D. Kerness , Arkadii V. Samoilov , Abhishek Sahasrabudhe
- Applicant: Maxim Integrated Products, Inc.
- Applicant Address: US NE Omaha
- Assignee: MAXIM INTEGRATED PRODUCTS, INC.
- Current Assignee: MAXIM INTEGRATED PRODUCTS, INC.
- Current Assignee Address: US NE Omaha
- Agency: Advent, LLP
- Agent Kevin E. West
- Main IPC: G01J5/12
- IPC: G01J5/12 ; H01L35/02 ; H01L35/14 ; H01L35/20 ; G01J5/02 ; H01L27/146

Abstract:
A device and techniques for fabricating the device are described for forming a wafer-level thermal sensor package using microelectromechanical system (MEMS) processes. In one or more implementations, a wafer level thermal sensor package includes a thermopile stack, which includes a substrate, a dielectric membrane, a first thermoelectric layer, a first interlayer dielectric, a second thermoelectric layer, a second interlayer dielectric, a metal connection assembly, a passivation layer, where the passivation layer includes at least one of a trench or a hole, and where the substrate includes a cavity adjacent to the at least one trench or hole, and a bond pad disposed on the passivation layer and electrically coupled to the metal connection assembly; and a cap wafer assembly coupled to the thermopile stack, the cap wafer assembly including a wafer having a cavity formed on a side of the wafer configured to be adjacent to the thermopile stack.
Public/Granted literature
- US20160163942A1 MEMS-BASED WAFER LEVEL PACKAGING FOR THERMO-ELECTRIC IR DETECTORS Public/Granted day:2016-06-09
Information query