Invention Grant
- Patent Title: Non-volatile random access memory (NVRAM)
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Application No.: US14501781Application Date: 2014-09-30
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Publication No.: US10446608B2Publication Date: 2019-10-15
- Inventor: Anirban Roy
- Applicant: FREESCALE SEMICONDUCTOR, INC.
- Applicant Address: US TX Austin
- Assignee: NXP USA, INC.
- Current Assignee: NXP USA, INC.
- Current Assignee Address: US TX Austin
- Main IPC: H01L23/522
- IPC: H01L23/522 ; H01L27/22 ; H01L27/24 ; H01L29/94 ; H01L23/485

Abstract:
A semiconductor device and methods for making the same are disclosed. The device may include: a first transistor structure; a second transistor structure; a capacitor structure comprising a trench in the substrate between the first and second transistor structures, the capacitor structure further comprising a doped layer over the substrate, a dielectric layer over the doped layer, and a conductive fill material over the dielectric layer; a first conductive contact from the first transistor structure to a first bit line; a second conductive contact from the second transistor to a non-volatile memory element; and a third conductive contact from the non-volatile memory element to a second bit line.
Public/Granted literature
- US20160093671A1 NON-VOLATILE RANDOM ACCESS MEMORY (NVRAM) Public/Granted day:2016-03-31
Information query
IPC分类: