Invention Grant
- Patent Title: Semiconductor device manufacturing method and recording medium
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Application No.: US15630472Application Date: 2017-06-22
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Publication No.: US10453676B2Publication Date: 2019-10-22
- Inventor: Masanori Nakayama
- Applicant: HITACHI KOKUSAI ELECTRIC INC.
- Applicant Address: JP Tokyo
- Assignee: KOKUSAI ELECTRIC CORPORATION
- Current Assignee: KOKUSAI ELECTRIC CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Volpe and Koenig, P.C.
- Priority: JP2014-262686 20141225
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H05H1/46 ; H01J37/32 ; H01L21/28 ; H01L27/11551 ; H01L21/321 ; H01L27/11524 ; H01L27/11556 ; H01L27/1157 ; H01L27/11582

Abstract:
A method of manufacturing a semiconductor device includes: preparing a substrate processing apparatus including a substrate process chamber having a plasma-generation space where a nitrogen-containing gas is plasma-exited and a process space where a substrate is mounted in communication with the plasma-generation space, an inductive coupling structure configured by a coil and an impedance matching circuit, wherein electric field combining the coil and the circuit has a length of an integer multiple of a wavelength of an high-frequency power, and a table to mount the substrate under a lower end of the coil; mounting the substrate on the table; supplying the nitrogen-containing gas into the chamber; starting a plasma excitation of the nitrogen-containing gas by applying the high-frequency power to the coil; and nitriding a surface of the substrate with active species containing a nitrogen element at an internal pressure of the chamber ranging from 1 to 100 Pa.
Public/Granted literature
- US20170287707A1 SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND RECORDING MEDIUM Public/Granted day:2017-10-05
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