Invention Grant
- Patent Title: Inspection device, control method for same, and non-transitory computer readable storage medium
-
Application No.: US15750204Application Date: 2016-11-25
-
Publication No.: US10466293B2Publication Date: 2019-11-05
- Inventor: Shuichi Misumi , Akihiko Sano
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto
- Agency: JCIPRNET
- Priority: JP2016-044780 20160308
- International Application: PCT/JP2016/085019 WO 20161125
- International Announcement: WO2017/154277 WO 20170914
- Main IPC: G01R27/26
- IPC: G01R27/26 ; G01R31/02 ; H02S50/10 ; G01R27/16 ; H02S50/00

Abstract:
Provided is an inspection device that can determine by itself whether a power-supply-side circuit (11, 22, 23) including a solar-cell string (11) is electrically isolated from a PCS (13, 130). The inspection device (14, 140) measures the impedance of the power-supply-side circuit including the solar-cell string (11) and determines whether the power-supply-side circuit is electrically isolated from the PCS (13, 130) on the basis of the capacitive component of the measured impedance.
Public/Granted literature
- US20180356453A1 INSPECTION DEVICE, CONTROL METHOD FOR SAME, NON-TRANSITORY COMPUTER READABLE STORAGE MEDIUM Public/Granted day:2018-12-13
Information query