Invention Grant
- Patent Title: Method for quantifying the intrinsic dimensions of radiation sensors, particularly ionizing radiation sensors, and device for implementing same
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Application No.: US15551193Application Date: 2016-02-17
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Publication No.: US10466374B2Publication Date: 2019-11-05
- Inventor: Nicolas Saurel , Nicolas Guillot
- Applicant: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
- Applicant Address: FR Paris
- Assignee: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERIGES ALTERNATIVES
- Current Assignee: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERIGES ALTERNATIVES
- Current Assignee Address: FR Paris
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: FR1551427 20150219
- International Application: PCT/EP2016/053319 WO 20160217
- International Announcement: WO2016/131852 WO 20160825
- Main IPC: G01T7/00
- IPC: G01T7/00 ; H01L31/02 ; G01T1/36 ; H01L27/02

Abstract:
A method for quantifying intrinsic dimensions of radiation sensors, particularly ionizing radiation sensors, and a device for implementing the method. The method for quantifying the intrinsic dimensions of a radiation sensor includes: defining and modeling the sensor using a schematic diagram of the sensor, determining via numerical computation and via experimental design theory elements that affect the sensor, measuring various specific spatial positions around the sensor, via a multi-frequency calibration source of the radiation, and designing, via experimental design theory, the elements that affect a response of the sensor.
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