Invention Grant
- Patent Title: Electron source for a free electron laser
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Application No.: US16072385Application Date: 2017-02-07
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Publication No.: US10468225B2Publication Date: 2019-11-05
- Inventor: Andrey Alexandrovich Nikipelov , Gerrit Jacobus Hendrik Brussaard , Wouter Joep Engelen
- Applicant: ASML Netherlands B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- Priority: EP16158928 20160307
- International Application: PCT/EP2017/052620 WO 20170207
- International Announcement: WO2017/153104 WO 20170914
- Main IPC: H01J37/073
- IPC: H01J37/073 ; H01S3/09 ; H05H7/08

Abstract:
An electron source, e.g. for a free electron laser used for EUV lithography comprises: • a cathode (203) configured to be connected to a negative potential (100, 101); • a laser (110) configured to direct pulses of radiation onto the cathode so as to cause the cathode to emit bunches of electrons; • an RF booster (180) connected to an RF source and configured to accelerate the bunches of electrons; and • a timing corrector (303, 313, 400, 401) configured to correct the time of arrival of bunches of electrons at the RF booster relative to the RF voltage provided by the RF source. The timing corrector may comprise a correction electrode (303, 313) surrounding a path of the bunches of electrons from the cathode to the RF booster and a correction voltage source (400, 401) configured to apply a correction voltage to the correction electrode.
Public/Granted literature
- US20190035594A1 Electron Source for a Free Electron Laser Public/Granted day:2019-01-31
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