Invention Grant
- Patent Title: Mounting system
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Application No.: US15735775Application Date: 2015-06-17
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Publication No.: US10470351B2Publication Date: 2019-11-05
- Inventor: Mitsuhiko Shibata
- Applicant: FUJI CORPORATION
- Applicant Address: JP Chiryu-shi
- Assignee: FUJI CORPORATION
- Current Assignee: FUJI CORPORATION
- Current Assignee Address: JP Chiryu-shi
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- International Application: PCT/JP2015/067448 WO 20150617
- International Announcement: WO2016/203571 WO 20161222
- Main IPC: H05K13/08
- IPC: H05K13/08 ; H05K13/00 ; H05K13/04

Abstract:
In a mounting system including multiple mounting machines, there is provided a mounting system that is capable of reducing the number of measurement devices that measure electrical characteristics of an electronic component. A control device controls a switching device in order to connect a measurement device and a mounting machine that transmitted request information for measuring the electrical characteristics of the electronic component. When transmitting an instruction for starting measurement to the measurement device and receiving a characteristic measurement value from the measurement device, the control device transfers the received characteristic measurement value to the mounting machine that transmitted request information.
Public/Granted literature
- US20180160577A1 MOUNTING SYSTEM Public/Granted day:2018-06-07
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